Vinarskii Evgenii M., Laputenko Andrey V. «Deriving tests for digital circuits at lower and higher abstraction levels» // Tomsk State University Journal of Control and Computer Science 2019. №47 C.110-117
Provkin Viktor A., Matrosova Anzhela Yu., Sukhoruchenko Ksenia A., Savenkova Marina M. «Testing of multi-output combinational circuits when reactions on test patterns are known» // Tomsk State University Journal of Control and Computer Science 2024. №69 C.134-143
